Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits

نویسندگان

  • O. Mrooz
  • A. Kovalski
  • J. Pogorzelska
  • O. Shpotyuk
  • M. Vakiv
  • Bohdan S. Butkiewicz
  • J. Maciak
چکیده

Degradation processes, caused by the extreme values of current pulses or thermal burn-in, are studied in thermistors with negative temperature coecient of resistance. The drift of thermistor resistance at 25°C is observed. These changes depend on the value and the number of current pulses. The ®rst 100 cycles are the basic ones for the future exploitation parameters of thermistors. Similar e€ect, rise of thermistor resistance, was observed after burn-in. The investigated thermistors are used for in-rush current protection of electronic circuits. Ó 2001 Elsevier Science Ltd. All rights reserved .

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 41  شماره 

صفحات  -

تاریخ انتشار 2001